Research Micro Speckle
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Research Micro Speckle
Stamps by 1900 Engineering LLC
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Pre-inked with Black Ink

Pre-inked with Black Ink

microSpeckle Stamp with Black Ink

For Optical DIC and SEM-Digital Image Correlation

No base coat required:  Specimen stamped with Black Ink

No base coat required: Specimen stamped with Black Ink

Black ink transfers from the stamp to a polished metal specimen, leaving the bare metal surface between speckles.  Islands of speckles are well-adhered to the surface and do not crack nor flake off during Digital Image Correlation experimentation. 

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Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Optical DIC Results of Fatigue Crack Growth

Optical DIC Results of Fatigue Crack Growth

Digital Image Correlation results from one micron base element black ink microSpeckle stamps

Pre-inked with EBSD transparent ink

Pre-inked with EBSD transparent ink

microSpeckle Stamp with selectively electron-transparent ink

For SEM-Digital Image Correlation

Pre-inked with EBSD transparent ink

Pre-inked with EBSD transparent ink

SEM of microSpeckle Stamp with selectively electron-transparent ink

For SEM-Digital Image Correlation

Pre-inked with EBSD transparent ink

Pre-inked with EBSD transparent ink

SEM of microSpeckle Stamp with selectively electron-transparent ink

For SEM-Digital Image Correlation

Specimen with EBSD Transparent Ink

Specimen with EBSD Transparent Ink

Left: Contrast for DIC at 5 kV. Right: Transparent for EBSD at 20 kV.

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Pre-inked with Black Ink
No base coat required:  Specimen stamped with Black Ink
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Optical DIC Results of Fatigue Crack Growth
Pre-inked with EBSD transparent ink
Pre-inked with EBSD transparent ink
Pre-inked with EBSD transparent ink
Specimen with EBSD Transparent Ink
“Microspeckle stamps are an effective way to achieve repeatability and efficiency in high-resolution digital image correlation measurements. They provide the repeatability of lithography, but with much reduced application time and costs. I have been working with these for several years and am excited about the capabilities they continue to enable.”
— Prof Jacob D. Hochhalter, University of Utah
1900 LLC
519 College Ave, Suite 33282,
Clemson SC 29631,
USA
info@1900engineering.com
Hours